Measurement Facilities

Measurement and Test Track – Precision Rail-Based Facility for Sensor Evaluation

The measurement and test track at Fraunhofer FHR provides a highly precise environment for the validation of sensors and measurement systems. A remotely controlled carrier platform travels along a rail system approximately 50 meters in length at precisely defined speeds and positions.

In combination with a laser-based reference system, measurement data can be directly and reliably verified. Parallel-aligned measurement axes enable the immediate comparison of sensor and reference data. Thanks to flexible operating modes, configurable target objects, and a low-interference environment, the facility is ideally suited for determining range and accuracy under realistic conditions.

It supports the development, calibration, and acceptance testing of advanced sensor systems.

Use Case Example

Climate Chamber – Environmental Test Facility for Temperature and Humidity Simulation

Extreme temperatures and humidity levels represent some of the most critical stress factors for technical systems. The climate chamber at Fraunhofer FHR enables the controlled and reproducible simulation of such environmental conditions.

Temperature ranges from −40 °C to +180 °C, combined with relative humidity levels between 10% and 98%, allow for the realistic replication of a wide variety of operational scenarios. This facilitates precise analysis of reliability, aging behavior, and functional integrity.

In addition to conventional climatic testing, the facility also supports thermal shock testing, long-term exposure studies, as well as power cycling under controlled conditions. Automated test sequences and continuous monitoring of key parameters ensure reproducible results, thereby providing a reliable basis for the qualification and optimization of advanced sensor systems.

Use Case Example

Heavy-Duty Rotary Platform – Precision Rotatable Measurement Platform for Signature Analysis

The heavy-duty rotary platform at Fraunhofer FHR is a key measurement facility for advanced radar signature analysis. With a diameter of 6 m, a load capacity of 25 t, and a positioning accuracy of 0.01°, it enables precise, angle-resolved characterization of large and heavy objects.

The platform can additionally be tilted from −3° to +10°, allowing for the realistic emulation of measurement scenarios for radar cross section (RCS) evaluations and imaging techniques such as two- and three-dimensional Inverse Synthetic Aperture Radar (2D and 3D ISAR). It is used, among other applications, for the assessment of stealth materials in accordance with international standards, the analysis of signature management measures, and complex radar imaging studies.

The heavy-duty rotary platform is continuously utilized in project-specific, non-public industrial and research engagements.

Measurement Techniques for the Determination of Electromagnetic Material Parameters – Analysis of Dielectric Properties of Materials

These measurement techniques enable the precise determination of electromagnetic properties of polymers, coating layers, and other materials over a frequency range from 100 MHz to 95 GHz. They are based on measurements of the transmission and reflection coefficients of plane electromagnetic waves interacting with single- or multi-layer material samples.

Depending on the frequency range, sample holders are available for both non-destructive and destructive testing. From the measured coefficients, both dielectric and magnetic material parameters can be derived.

The method is suitable for the evaluation of radomes, automotive body components, plastic covers, housings, shielding structures, absorbers, substrates, coating systems, stealth materials, metamaterials, as well as other functional surfaces and composite structures.

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Anechoic Measurement Chambers – Analysis of Radiation and Scattering Characteristics

The anechoic measurement chambers at Fraunhofer FHR enable the precise determination of key parameters of antennas, antenna systems, and electromagnetically active structures over a frequency range from 300 MHz to 400 GHz. Depending on the application, far-field measurements with distances of up to 7.2 m are available, as well as planar or spherical near-field scanning with areas of up to 1.5 × 1.5 m and volumes with diameters of up to 4.3 m. Scattering objects can be characterized under controlled conditions with respect to their backscattering behavior. The chambers are suitable for the development and evaluation of antennas, the measurement of radar-based signature parameters, the investigation of stealth technologies, metamaterials, and functional surfaces, as well as the analysis of reflectarrays and other scattering structures. Reliably Locating Shipwreck Survivors

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Spherical Near‑Field Scanner – Characterization of Complex Antenna Structures

The spherical near-field scanner enables precise measurement of antennas and scattering structures in the millimeter-wave range. The measurement system captures an almost spherical solid angle of 360 degrees in azimuth and 270 degrees in elevation with an angular resolution of 0.01 degrees. The device under test can be positioned along three axes, allowing the object to be aligned exactly at the center of the measurement sphere. The system is prepared for on-chip measurements and can be extended to frequency ranges of up to 500 gigahertz באמצעות interchangeable frequency band modules. This makes the setup suitable for the development, simulation, and validation of novel antenna and radome structures, including geometrically complex or additively manufactured designs. It also supports investigations of integrated circuits and high-frequency components in the extended millimeter-wave domain.

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Cryogenic Measurement Platforms – Precision Characterization at Extremely Low Temperatures

The cryogenic measurement platforms at Fraunhofer FHR enable high-precision characterization of electronic and high-frequency components under realistic operating conditions at temperatures as low as 1.5 kelvin. The cryogenic laboratory provides several specialized systems that support measurements on components ranging from wafers to complex assemblies. The range of capabilities includes S‑parameter and impedance measurements, noise figure measurements, as well as amplifier and filter characterization across wide frequency ranges. These detailed analyses under cryogenic conditions are essential for applications in quantum computing, millimeter-wave technology, and radio astronomy. As such, the platforms offer a key foundation for the development and optimization of high-performance high-frequency and quantum systems.