High-frequency Measurement Characterization of Antennas and RF Circuits

Fraunhofer FHR is equipped with a variety of instruments and facilities to perform numerous types of RF measurements. This includes the characterization of antennas and RF circuits, monostatic radar cross section (RCS), and measurements of electromagnetic material parameters. In addition to standard procedures, customized measurement solutions can also be developed. Our in-house precision mechanics workshops provide valuable support.

© FRAUNHOFER FHR
Anechoic chamber for planar or spherical near field antenna measurements.
© FRAUNHOFER FHR
Anechoic chamber for farfield antenna and RCS measurements.
© FRAUNHOFER FHR
Anechoic chamber for planar or spherical near field antenna measurements.

High-end technology ensures precise results

The institute’s customers and partners benefit from state-of-the-art measurement technology. This includes several vector network analyzers (VNA) along with numerous calibration standards, spectrum analyzers, and RF power meters. Network measurements can be performed up to 95 GHz via various connector types. Programmable high-end DC sources and measurement equipment for automated characterization of active RF circuits are also available.

Anechoic test chambers and outdoor test facility

Several anechoic test chambers are operated for antenna and scattering measurements. The test configurations can be flexibly chosen for far-field (7.2 meters) and spherical, cylindrical, or planar near-field measurements with near-field/far-field transformations. The frequency range extends from 300 MHz to 400 GHz, and indoor antennas with dimensions up to 4.3 meters can be examined. Larger scattering objects are measured on an outdoor test site with a tilting 6-meter turntable, which can carry up to 25 tons.

Characterization of electromagnetic properties and geometric inspection of objects

To determine the electromagnetic properties of solid or liquid materials, a range of procedures has been developed that can be employed depending on the frequency range, sample size, and expected results. For geometric inspection of printed circuit boards or other objects with a precision of up to one micrometer, digital optical microscopes can be used for semi-automatic characterization of small series.

Upon request, the institute also conducts specific measurement projects in which the high-end equipment and the researchers’ extensive experience at Fraunhofer FHR are made available to the client.